Probe Card Analyzers & Semiconductor Test Equipment - Integrated Technology Corporation

	Probilt Series Datasheet
	PB6500/6800 Datasheet Specs - 6500 Specs - 6800
	PB3600 Datasheet Specifications
	PB1500 Datasheet Specifications
	PB1200 Datasheet Specifications
	ProbeTracker™
	Upgrade Program
	Motherboards List Ordering
	Training Modules Request
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Probilt™ PB1500

	Overview The Probilt "Low Cost Line" is a totally new concept in probe card test and repair. These systems are designed for stand alone use and as a companion tool for the higher end probe card analyzers. The probe card is tested and repaired in a "tips up" position which eliminates the time to flip from test to repair position. They may be used to perform a complete test or import test data from a larger analyzer. Repair and retest of individual probes is easily performed. Specialized software routines quickly identify the failing probe and place a crosshair at the correct position for quick and easy alignment. After repair, each individual probe may be retested for alignment and planarity. A live video image of the probe under repair and the crosshair is shown on the video monitor. The PB1500 is a low cost probe card analyzer system. It has the capability to perform all the tests done on the larger PB3500/6500 probe card analyzers, but at a lower cost for low pincount cards.
A maximum of 1,280 channels may be configured in the PB1500 MUX system. The Precision Measurement Unit (PMU) has the same accuracy, repeatability and range as the larger analyzers. The repair process consists of selecting a failing probe, which moves it under the binocular microscope and positions a crosshair over the correct position for that probe. Thus the probe is not only easily identified, the operator has a true reference (the crosshair) for the correct alignment position. The repair process time is cut to 1/2 or 1/3 that of standard analyzers or alignment stations The PB1500 is a bench top instrument and comes complete with all required hardware. ITC provides low cost, standard motherboards for most probe card types. A sturdy bench option provides the optimum in convenience and ergonomics.
Features Fast, simple probe card repair Crosshair shows proper probe position Tips up configuration for easy repair Excellent ergonomics Fast retest without flip Leica MZ12.5 binocular microscope Accurate, repeatable stage Closed loop with 0.1u encoders 6" x 6" stage movement Up to 3" x 3" arrays 50 lb. Force Z stage, 0.5" stroke Simple, economical motherboards Up to 1,280 channels Fast change motherboards/probe cards Up to 17" diameter probe cards Powerful Probilt™ software Same software as PB3500/6500 Network with PB3500/6500 Works with all probe card technologies Test and repair any technology Excellent for tight pitch shelf cards
Test Performed Alignment Planarity Contact Resistance Leakage Wire Check Capacitor values and leakage Resistor values Gram Force (optional)