Probe Card Analyzers & Semiconductor Test Equipment - Integrated Technology Corporation

	Probilt Series Datasheet
	PB6500/6800 Datasheet Specs - 6500 Specs - 6800
	PB3600 Datasheet Specifications
	PB1500 Datasheet Specifications
	PB1200 Datasheet Specifications
	ProbeTracker™
	Upgrade Program
	Motherboards List Ordering
	Training Modules Request
	Literature
	Application Notes FAQs
	Events

Probilt™ PB6500/6800

	Overview The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured. Now, Probilt's new PB6800 large measurement chuck allows probe arrays as big as 300 mm in diameter to be touched down without overhanging the chuck surface.
The Probilt has many features that make it the ideal analyzer for all probe card technologies, including the newest probe cards being used to test the largest memory arrays. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB. With 440 lbs of lift force, it has long been recognized as the analyzer of choice for vertical probe card manufacturers. The optional ProbeTracker, software controlled upper microscope drive, makes the Probilt the only probe card analyzer that has the capability to specifically identify failing probes and present them to the operator for repair in the tips-up orientation. Once the repair is complete each probe can be retested for alignment to verify it is correctly positioned before moving to the next failing probe. This means that even the finest pitch shelf cards can be repaired in a fast and efficient manner. Additionally, the ProbeTracker's unique auto-locate function can be used to easily find and identify a probe tip for inspection in the most densely packed high pin-count probe arrays.
Features New PB6800 offers 12" dia. chuck for 300 mm arrays High volume production throughput Fast Pentium P4 Processor Distributed Processing Overlapped Tests Windows 2000 or XP Operating System Motherboard/MUX Interface - No Cables 12,000 Channel Capability Kinematic coupling for high repeatability Fast motherboard and probe card change Software configurable relay control Enhanced high performance LED lighting Portable lighting recipes for all technologies Tests all probe card technologies Closed loop stage with 0.1µ encoders 12" x 8" stage travel for largest cards 440 lbs (200Kg) force Z stage, 0.75" travel Powerful, easy to use software Simple test program generation e-Diagnostics Service Tool Built-in parameter plots 16 bit Precision Measurement Unit Highly accurate/repeatable analog measurements Polar & non-polar capacitors Series/parallel resistors
Test Performed Leakage OD Leakage Capacitor Leakage Alignment Scrub Analysis Tip Diamter Planarity Contact Resistance Wire Check Gram Force Tip Depth Elevated Heat Levels with our Hot Chuck option Component Measurement for: Relays Capacitors Resistors