Probe Card Analyzers & Semiconductor Test Equipment - Integrated Technology Corporation

	ITC55 Product Series DataSheet
	ITC55100 DataSheet Specifications
	ITC55300 DataSheet Specifications
	ITC59000 DataSheet Specifications
	ITC59100 DataSheet Specifications
	ITC59 / 55 DataSheet
	ITCWPS DataSheet Specifications
	Load Boxes ITC5514A ITC5514B ITC5515 ITC5516 ITC55140
	PTNET
	ITC5730 DataSheet Specifications
	ITC57300 DataSheet Specifications
	ITC5230 DataSheet Specifications
	Test Accessories ITC55HVD1 ITC55MTS220 ITC55MTSAXR ITC55MTSDGEN ITC55MUX4 ITC55RSF
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ITC55300 Unclamped Inductive Load Tester

	Overview Model ITC55300 is the high current (400A) version of the ITC55100 tester. The ITC55300 performs the same tests as the ITC55100 and includes many features that improve testing accuracy, test results collection, test results viewing, and multiple tester networking. The ITC55300 has the added capability of testing dual devices; N-channel, P-channel or combination.
Model ITC55300 performs ruggedness testing of power MOSFETs, discretes and modules and IGBTs, discretes and modules. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box. The ITC55300 performs several types of tests that conform to MIL-STD-750C Method 3470. Method 3470 tests the capability of P- and N-Channel MOSFETs and IGBTs by stressing them to controlled energy levels. This is accomplished by the devices driving an unclamped inductive load.
Test Modes Single-Pulse Unclamped Inductive Switching (UIS) Single-Pulse Avalanche Stress (EAS) Repetitive Avalanche Energy (EAR) Repetitive Pulse to Failure (RPF)
Test Performed Continuity test of device socket and/or contacts DC zero gate bias Drain-to-Source leakage test - pre and post avalanche Functional device test Avalanche test
Features Single/Dual Device Testing N channel, P channel, Mixed All Solid State Switching - No Relays Faster Testing Current Range: 0.1A to 400A, 0.1A Steps Avalanche Voltage to 2500V Touch-Screen Program Entry/Control Waveform Capture/Display Internal Test Program Storage (20 files) High Speed Inductor Charging, Reduces Test Time Programmable Leakage Test Voltage Pre/Post Avalanche Leakage Test Avalanche Collapse Test Versatile Test Handler Control Up to 15 Hardware Sort Bins Improved Voltage/Current Accuracy Software Updates via Flash Download High Speed RS-485 PTNet Interface Password Control of Parameter Entry Operates with all ITC Inductor Load Boxes Interfaces with ITC55MUX4 & ITC55-RSF Built-in Self Test
Safety Features Test time-out Excessive leakage shutdown External safety lockout Two parallel connected Manual Start push buttons Device currents are constantly monitored. Testing is terminated if currents exceed or fail to reach programmable levels in a specified or calculated time.