Probe Card Analyzers & Semiconductor Test Equipment - Integrated Technology Corporation

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ITC59000 Test Platform

	Overview The ITC59000 Test Platform is a desktop Dynamic Parametric Test System mainframe. The ITC59000 Test Platform accepts up to four Test Measurement Units (TMUs) that perform transient measurements on semiconductor devices such as power MOSFETs, IGBTs, bipolar devices, and diodes. Each TMU can perform the same semiconductor test or a different type test. The TMUs are specifically designed to perform a particular test and provide test results and binning based on user-defined specifications and sorting criteria.
Because the ITC59000 Test Platform can contain up to four TMUs that operate in parallel, it can control four handlers or some combination of one to four handlers. The ITC59000 provides data logging and statistical information regardless of the type of TMU installed. A contactor database stores all test specifications, handler configurations, test results. Long cables and the overall length of contact to the device under test (DUT) could introduce noise or parasitic inductance/capacitance into the test. To overcome this each TMU is connected by a cable to a small measurement pod. The measurement pod needs to be located as close as practical to the handler contactor or manual test socket but the main test unit can be located where it is practical and comfortable for the operator to use.
Features Up to 4 Parallel, processor controlled, independent TMUs TMUs are completely floating to allow for parallel half and full bridge tests Pentium Computer with embedded XP Operating System and an 80 GB hard drive Front and rear panel USB ports for Keyboard, Mouse and Printer (not required for local operation) LCD front panel touch screen for all user inputs and results display VGA Connector on rear panel 10/100 Ethernet 4 independently programmable Handler interfaces Operator log-in and access control for better tracking Local and remote operating modes Self check of all operating voltages to ensure accurate measurements and results All devices in a package are tested before sorting and binning.
TMU types Shown below is a list of the Test Measurement Units planned for the ITC59000 Test System Platform. The first TMU to be released is the ITC59100. ITC59100 Qg/Rg ITC59200 Die Attach/FBSOA ITC59300 (Planned) Low Current UIL NOTE: ITC may have other TMUs under development. Please call for information on the latest TMUs or if you have a special requirement.
Possible Test Configurations The ITC59000 has several possible test configurations because each of the four TMUs and the four handler ports can operate independently of each other. Each TMU can test a separate device and provide binning information for that device to separate handlers. If the package contains four devices, all four TMUs can be connected to one handler, which is controlled by one handler port from the ITC59000. The following is one example of many possible ways to connect an ITC59000 Test System Platform with a maximum of four TMUs installed.