ITC55 Product Series
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  ITC55100
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    ITC5230
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       Specifications
    Test Accessories
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ITC5230 Power Cycling Life Test System
The ITC5230 is designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC5230C is an enhanced version of the ITC5230B.)

Testing meets the requirements of MIL-STD-750, Methods 1026.3, 1027.1, 1036.3, 1037, and 1042.1.

Once set up, the operation of the ITC5230 is fully automatic and can be operated around the clock without operator attention.

Test devices plug into DUT boards that are plugged into power and monitoring circuits inside a chamber that can hold up to 16 different device test boards with a maximum of 80 devices per board.

Each test board has a Test Complete LED that is turned on when the devices on that board have completed the test cycle.

Because each board is individually tracked, test boards can be inserted or removed from the test chamber without negating the test cycle on the other boards.

Custom DUT boards or a general purpose DUT board with custom inserts configure the package type or pinouts, allowing the ITC5230 to handle a wide variety of device types and packages.

All B model DUT boards can be used in the C model, but new measurement and test features may not be operational with the older boards.

ITC5230C Device testing is controlled and monitored by a PC/AT compatible computer. This computer provides greater hardware and software flexibility and allows for future hardware and software enhancements.

On Model C DUT boards, the Controller measures each device's ON current and junction voltage and converts the measurements to die temperatures using customer supplied conversion constants. (Not available on the generic DUT board.)

Additionally, ON current, ON time, device polarity, and test voltage are computer programmable (per board), allowing each board to test different device types and different packages. For Model B DUT boards, On time must be the same for all boards and test voltage is switch selected on each board.

For operator safety, all VDD power to all test boards is removed and the chamber blower is turned off when the test chamber door is opened on the ITC5230C. Also, device testing is interrupted but automatically restarted with a cooling cycle when the chamber door is closed.

 
Features
  • Good devices are not physically or electrically damaged.
  • Test events and test results may be exported for manipulation and viewing without interrupting the test cycle.
  • Reports can be generated at any time.
  • Custom DUT personality boards may be provided by ITC to meet the requirements of any customer.
  • User-friendly and interactive menus.
  • Previous computer experience not required.
ITC5230
  • Maximum of 80 DUTs per board
  • Device type/polarity controlled by board jumpers and readable by the controller
  • All DUTs can be measured for temperature (On generic boards, DUT #15 is wired to measure junction temperature.)
  • Each board's voltage/heat cycle computer controlled
Capabilities
  • Tests power Bipolars, Hybrids, IGBTs, MOSFETs, and SMDs using Military Standard: MIL-STD-750, Methods 1026.3, 1027.1, 1036.3, 1037, 1039, and 1042.1.
  • Intermittent or steady-state operating life test.
  • Board independent device and polarity selection.
  • 10-Amp VDD 24V/48V power supply for each device board.
  • Individual device monitoring and data logging.
  • Maximum of 80 devices per DUT board available.
  • Device power of 480 watts per DUT board.
  • A maximum of 16 DUT boards
  • DUT test boards may be inserted any time without interrupting the test cycle.
Typical DUT Boards
TO-3/TO-66, TO-39/TO-5, TO-61
TO-220/TO-218/TO-3P (Plastic)
TO-254/TO-218/TO-247 (Metal)

Other DUT board configurations are available. Custom boards can be developed to fit specific devices or customer requirements.

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