Probe Card Analyzers & Semiconductor Test Equipment - Integrated Technology Corporation

	ITC55180 DataSheet
	ITC55350 DataSheet
	ITC55 Product Series DataSheet
	ITC55100 DataSheet Specifications
	ITC55100C DataSheet
	ITC55300 DataSheet Specifications
	ITC59000 DataSheet Specifications
	ITC59100 DataSheet Specifications
	ITC59 / 55 DataSheet
	ITCWPS DataSheet Specifications
	Load Boxes ITC5514A ITC5514B ITC5515 ITC5516 ITC55140
	ITC57300 DataSheet Specifications
	ITC5230 DataSheet Specifications
	Test Accessories ITC55HVD1 ITC55MTS220 ITC55MTSAXR ITC55MTSDGEN ITC55MUX4 ITC55RSF
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ITC55100C

	Overview Model ITC55100C is the latest generation of the industry standard series of ITC55100 testers. The system has been designed around a very powerful micro-controller that gives it a timing resolution of 40ns, twenty times faster than the previous model. Its response time to the peak and zero current is improved ten times. Combined this gives greater accuracy for the charging and avalanche times and for the reported peak drain current. Model ITC55100C has a bipolar gate drive as a standard feature. The user can set a total gate drive of up to 30V and can select how much of the 30V is positive and how much of it is negative. This feature ensures that the device is held off during avalanche as required for certain devices.
The ITC55100C performs several types of tests that conform to MIL-STD-750E Method 3470. Method 3470 tests the capability of P- and N-Channel MOSFETs and IGBTs by stressing them to controlled energy levels. This is accomplished by the devices driving an unclamped inductive load.
Test Modes Single-Pulse Unclamped Inductive Switching (UIS) Single-Pulse Avalanche Stress (EAS) Repetitive Avalanche Energy (EAR) Repetitive Pulse to Failure (RPF)
Test Performed Continuity test of device socket and/or contacts DC zero gate bias Drain-to-Source leakage test - pre and post avalanche Functional device test Avalanche test
Features Single/Dual Device Testing N channel, P channel, Mixed All Solid State Switching – No Relays Timing Resolution of 40ns Current Range: 0.1A to 200A, 0.1A Steps Avalanche Voltage to 2500V Bipolar Gate Drive with 30V swing New High Efficiency Kelvin Circuit Conventional UIL mode (via GPIB) Touch-Screen Program Entry/Control Waveform Capture/Display Internal Test Program Storage (20 files) High Speed Inductor Charging, Reduces Test Time Programmable Leakage Test Voltage Pre/Post Avalanche Leakage Test Avalanche Collapse Test Versatile Test Handler Control Up to 15 Hardware Sort Bins Improved Voltage/Current Accuracy Software Updates via Flash Download Password Control of Parameter Entry Operates with all ITC Inductor Load Boxes Interfaces with ITC55MUX4 & ITC55-RSF Simple, Complete User Calibration Built-in Self Test
Safety Features Test time-out Excessive leakage shutdown External safety lockout Two parallel connected Manual Start push buttons Device currents are constantly monitored. Testing is terminated if currents exceed or fail to reach programmable levels in a specified or calculated time.