Model ITC55350 performs ruggedness testing of power MOSFETs, discretes and modules and IGBTs, discretes and modules. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.

• Single-Pulse Unclamped Inductive Switching (UIS)
• Single-Pulse Avalanche Stress (EAS)
• Repetitive Avalanche Energy (EAR)
• Repetitive Pulse to Failure (RPF)

• Continuity test of device socket and/or contacts
• DC zero gate bias Drain-to-Source leakage test
  - pre and post avalanche
• Functional device test
• Avalanche test

• Single/Dual Device Testing
• N channel, P channel, Mixed
• All Solid State Switching - No Relays
• Faster Testing
• Current Range: 0.1A to 200A, 0.1A Steps
• Avalanche Voltage to 2500V
• Touch-Screen Program Entry/Control
• Waveform Capture/Display
• Internal Test Program Storage (20 files)
• High Speed Inductor Charging, Reduces Test Time
• Programmable Leakage Test Voltages
• Pre/Post Avalanche Leakage Test
• Avalanche Collapse Test
• Versatile Test Handler Control
• Up to 15 Hardware Sort Bins
• Improved Voltage/Current Accuracy
• Software Updates via Flash Download
• Password Control of Parameter Entry
• Operates with all ITC Inductor Load Boxes
• Interfaces with ITC55MUX4 & ITC55-RSF
• Built-in Self Test

• Test time-out
• Excessive leakage shutdown
• External safety lockout
• Two parallel connected Manual Start push buttons
• Device currents are constantly monitored. Testing is terminated if currents exceed or fail to reach
  programmable levels in a specified or calculated time.