Probe Card Analyzers & Semiconductor Test Equipment - Integrated Technology Corporation

	ITC55 Product Series DataSheet
	ITC55100 DataSheet Specifications
	ITC55300 DataSheet Specifications
	ITC59000 DataSheet Specifications
	ITC59100 DataSheet Specifications
	ITC59200 DataSheet Specifications
	ITCWPS DataSheet Specifications
	Load Boxes ITC5514A ITC5514B ITC5515 ITC5516 ITC55140
	PTNET
	ITC5730 DataSheet Specifications
	ITC5230 DataSheet Specifications
	Test Accessories ITC55HVD1 ITC55MTS220 ITC55MTSAXR ITC55MTSDGEN ITC55MUX4 ITC55RSF
	Literature
	Application Notes FAQs
	Events

Test Equipment

ITC59100 Qg/Rg Test System

	The ITC59100 is a production test system for Gate Charge (Qg) and Internal Gate Resistance (Rg). Both Qg and Rg are automatically tested according to programmed parameters. The system provides up to 4 parallel measurement channels to allow up to 4 separate devices to be tested in parallel with no multiplexing, at test speeds less than 50 mS for extremely high throughput.

See Details See Demo

55100 High-Current Inductive Load Tester

	The ITC55100 is an improved version of the successful and industry standard ITC5510 tester. The ITC55100 performs all of the tests of the ITC5510 while adding many features that improve testing accuracy, test results collection, test results viewing, and multiple tester networking. The ITC55100 performs ruggedness testing of power MOSFETs and IGBTs. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC5510F-RSF Output Selector Box The ITC55100 has the added capability of testing dual devices; N-channel, P-channel or combination.

See Details

55300 High-Current Inductive Load Tester

	Model ITC55300 is the high current (400A) version of the ITC55100 tester. The ITC55300 performs the same tests as the ITC55100 and includes many features that improve testing accuracy, test results collection, test results viewing, and multiple tester networking. The ITC55300 has the added capability of testing dual devices; N-channel, P-channel or combination. Model ITC55300 performs ruggedness testing of power MOSFETs, discretes and modules and IGBTs, discretes and modules. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.

See Details

ITCWPS Chip / Wafer Probe System

	In response to the semiconductor industry's need to perform comprehensive power semiconductor testing at the chip and wafer level, ITC has developed a unique patent-pending product line that makes it possible to fully test these high-voltage, high current devices using a probe card. ITC Wafer Probe Systems can adapt ITC package-level testers for wafer-level and die-level testing.

See Details

5730 Dynamic Parametric Test System

	The ITC5730 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices. Included in the mainframe are all test equipment and software necessary to analyze and perform switching time, switching loses, gate charge, Trr/Qrr, and other transient tests.

See Details

5230 Power Cycling Semiconductor Life Systems

	ITC5230 models are designed for high-volume intermittent or steady-state operating life testing on Insulated Gate Bipolar Transistors (IGBTs), power MOSFETs, diodes, and other bipolar devices in a production environment. (The ITC5230C is an enhanced version of the ITC5230B.)

See Details

Home | SiteMap
Copyright 1987-2008 Integrated Technology Corporation. All Rights Reserved.
ITC is committed to protecting your privacy
Site Problems or Suggestions: Contact: webmaster