Characterization and Reliability testers include:Dynamic Parametric Test System that performs non-destructive transient measurements on semiconductor devices.Power Cycling Semiconductor Life Test System that performs high volume, intermitent or steady-state operating life testing on power semiconductor devices.


The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that...

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The ITC52300 is designed for high-volume intermittent or steady-state operati...

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