Abstract submitted to
IEEE Southwest Test Workshop 2008

"Practical Considerations for Full Power Avalanche Testing of Power Semiconductor Wafers and Die"

"Rod Schwartz, VP and Technical Director of ITC, accepts the award for "Best Presentation, Tutorial in Nature" on behalf of Steve Clauter. Steve's presentation, "Real World Avalanche Testing of Bare Die, Wafers, Hybrid Modules and Packaged Devices" explained the difficulties related to using probe cards at high current and high energy testing. He then went on to explain the techniques and equipment available to overcome these difficulties.

Authors and Presenters:

Steven T. Clauter, Test Equipment Design Engineer
Integrated Technology Corporation
1228 N. Stadem Drive Tempe, AZ 85281
USA
480-968-3459 x328
480-968-3099 FAX
stevec@inttechcorp.com
www.inttechcorp.com

Taichi Ukai, President and CEO
Tiatech, Incorporated
2-19-12 Kojima, Taito-Ku
Tokyo, 111-0056
Japan
+81-3-5823-5323
+81-3-5823-5324 FAX
ukai@tiatech.com
www.tiatech.com

About ITC
Integrated Technology Corporation (ITC) has been serving the needs of our customers for more than 30 years. ITC is a world leader in probe card metrology and repair tools as well as equipment for dynamic testing of power semiconductor devices. Our equipment is recognized around the world for providing leading edge test capability and extremely high reliability. We are dedicated to serving our customers with the best solutions possible. ITC is constantly committing a major portion of its effort to developments that enhance the state of the art in its field. The manufacturing capability is vertically integrated, with a fully equipped machine shop using automated machining centers, CAD for electrical and mechanical design and a complete electronic circuit board manufacturing and testing capability. This guarantees our customers the best delivery, quality and support. ITC also maintains a worldwide staff of service and training personnel to insure customer support.