Tempe, Arizona - January 16, 2004 - ITC is proud to introduce the latest revision of software for the Probilt probe card analyzers with dramatic improvements in speed, repeatability and ease of use.

HIGH THROUGHPUT - The number one goal in the development of this software was to further increase the throughput performance of the Probilt probe card analyzer, which in turn maximizes the investment made by the customer. By combining the various tests run on a probe card and overlapping the data analysis with stage motion the new software brings huge speed increases to the probe card analysis process. We can now run the leakage test during the alignment test and do the planarity, contact resistance, gram force and wire check tests for each probe with a single touch on the isolation pin. Combine this software with the new image capture cards and further speed improvements can be seen during the alignment test alone. The software also takes maximum advantage of the P4 processor speeds.

EASE OF USE - The new software has improved routines for the initial set-up of the lower optics and lighting, automating the process so that there is consistency across lighting recipes and less operator subjectivity. Revision 5.0 has no need for system calibrations to be run other than during the pre-defined maintenance time which is usually no more than once or twice per year depending on the customers preference.

IMPROVED REPEATABILITY - As well as speed, revision 5.0 also brings improvements in repeatability. This improvement is predominantly because it requires less user intervention and the system is therefore less susceptible to operator to operator set-up differences.

MACHINE TO MACHINE REPEATABILITY - The automating of the lower optics set-up allows lighting recipes to be imported and exported between machines within the customer facility and between the customer and their probe card supplier.

LOWER OPERATING COSTS - The reduction in user intervention and the automation of the lower lighting set-up resulting in greater consistency in the probe card analysis process should consequently lead to an overall reduction in the operating costs of the probe card analysis and repair operation.

KEY FEATURES OF VERSION 5.0

• Combined tests for increased speed
• Leakage during alignment test
• Planarity, contact resistance, wire check and gram force at same time
• Automated lighting and camera set-up
• Direct import of test results into JMP for easy data analysis
• No Calibration
• Improved E-Diags

To see the complete release notes, click here.