{"id":33,"date":"2021-04-29T19:04:20","date_gmt":"2021-04-30T02:04:20","guid":{"rendered":"https:\/\/planbetterworkbetter.com\/tech\/equipment\/?page_id=33"},"modified":"2022-09-08T12:18:20","modified_gmt":"2022-09-08T19:18:20","slug":"probilt-probe-card-analyzers","status":"publish","type":"page","link":"https:\/\/www.inttechcorp.com\/equipment\/probilt-probe-card-analyzers\/","title":{"rendered":"Probilt\u2122 Probe Card Analyzers"},"content":{"rendered":"

PB1500<\/a><\/h2>\n

PB3600<\/a><\/h2>\n

PB6500<\/a><\/h2>\n

PB6800<\/a><\/h2>\n
\n

The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured. Probilt\u2019s PB6800 large measurement chuck allows probe arrays as big as 300 mm in diameter to be touched down without overhanging the chuck surface.<\/p>\n

The Probilt has many features that make it the ideal analyzer for all probe card technologies, including the newest probe cards being used to test the largest memory arrays. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB. With 300Kg of lift force, it has long been recognized as the analyzer of choice for vertical probe card manufacturers.<\/p>\n

\"\"<\/p>\n

PB3600 PB6500 PB6800<\/p>\n

Tests Performed<\/h2>\n

\u2022 Leakage
\n\u2022 OD Leakage
\n\u2022 Capacitor Leakage
\n\u2022 Alignment
\n\u2022 Scrub Analysis
\n\u2022 Tip Diameter
\n\u2022 Planarity
\n\u2022 Contact Resistance
\n\u2022 Wire Check
\n\u2022 Gram Force
\n\u2022 Tip Depth
\n\u2022 Elevated Heat Levels with our Hot Chuck option
\n\u2022 Component Measurement for:
\no Relays
\no Capacitors
\no Resistors<\/p>\n

 <\/p>\n","protected":false},"excerpt":{"rendered":"

PB1500 PB3600 PB6500 PB6800 The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured. Probilt\u2019s PB6800 large measurement chuck allows probe arrays […]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-33","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/pages\/33","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/comments?post=33"}],"version-history":[{"count":17,"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/pages\/33\/revisions"}],"predecessor-version":[{"id":431,"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/pages\/33\/revisions\/431"}],"wp:attachment":[{"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/media?parent=33"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}