{"id":51,"date":"2021-04-29T19:31:28","date_gmt":"2021-04-30T02:31:28","guid":{"rendered":"https:\/\/planbetterworkbetter.com\/tech\/equipment\/?page_id=51"},"modified":"2022-02-20T16:57:55","modified_gmt":"2022-02-20T23:57:55","slug":"pb6500","status":"publish","type":"page","link":"https:\/\/www.inttechcorp.com\/equipment\/probilt-probe-card-analyzers\/pb6500\/","title":{"rendered":"PB6500"},"content":{"rendered":"<p><a href=\"..\/..\/..\/images\/equipment\/PB6500-Datasheet.pdf\" target=\"_blank\" rel=\"noopener\">PB6500 Datasheet<\/a> | <a href=\"https:\/\/www.inttechcorp.com\/equipment\/wp-content\/uploads\/2022\/01\/PB6500-SS.pdf\" target=\"_blank\" rel=\"noopener\">PB6500 Spec Sheet<\/a> | <a href=\"..\/..\/..\/images\/equipment\/PB6000-Series-Datasheet.pdf\" target=\"_blank\" rel=\"noopener\">PB6000 Series Datasheet<\/a><\/p>\n<p><img decoding=\"async\" class=\"size-full wp-image-330 aligncenter\" src=\"https:\/\/www.inttechcorp.com\/equipment\/wp-content\/uploads\/2021\/11\/PB6500.png\" alt=\"\" width=\"100%\" srcset=\"https:\/\/www.inttechcorp.com\/equipment\/wp-content\/uploads\/2021\/11\/PB6500.png 1000w, https:\/\/www.inttechcorp.com\/equipment\/wp-content\/uploads\/2021\/11\/PB6500-300x236.png 300w, https:\/\/www.inttechcorp.com\/equipment\/wp-content\/uploads\/2021\/11\/PB6500-768x605.png 768w\" sizes=\"(max-width: 1000px) 100vw, 1000px\" \/><\/p>\n<p>The Probilt PB6500 has many features that make it the ideal analyzer for all probe card technologies, including the latest probe tip geometries being used to test leading edge semiconductor devices. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB. With 300Kg of lift force, it has long been recognized as the analyzer of choice for vertical probe card manufacturers.<\/p>\n<p>The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured.<\/p>\n<h3 style=\"text-align: left;\">PB6500<\/h3>\n<p style=\"text-align: left;\">\u2022 11\u201d x 9.5\u201d chuck for 200mm arrays<br \/>\n\u2022 Motherboard\/MUX Interface \u2013 No Cable<br \/>\n\u2022 Enhanced high performance LED lighting<br \/>\n\u2022 Closed loop stage with 0.1\u03bc encoders<br \/>\n\u2022 12\u201d x 8\u201d stage travel for largest cards<br \/>\n\u2022 &#8211; 300Kg force Z stage, 0.75\u201d travel<br \/>\n\u2022 Powerful, easy to use software<br \/>\n\u2022 16-bit Precision Measurement Unit<br \/>\n\u2022 Probe Tracker (Optional)<br \/>\n\u2022 12,000 maximum test channels<\/p>\n<h3>Features<\/h3>\n<ul>\n<li>PB6500 offers 11 x9.5\u201d chuck for 200 mm arrays<\/li>\n<li>High volume production throughput<\/li>\n<\/ul>\n<p style=\"padding-left: 60px;\">&#8211; Fast Quad Core Processor<\/p>\n<p style=\"padding-left: 60px;\">&#8211; Distributed Processing<\/p>\n<p style=\"padding-left: 60px;\">&#8211; Overlapped Tests<\/p>\n<ul>\n<li>Motherboard\/MUX Interface \u2013 No Cables<\/li>\n<\/ul>\n<p style=\"padding-left: 60px;\">&#8211; 12,000 Channel Capability<\/p>\n<p style=\"padding-left: 60px;\">&#8211; Kinematic coupling for high repeatability<\/p>\n<p style=\"padding-left: 60px;\">&#8211; Fast motherboard and probe card change<\/p>\n<p style=\"padding-left: 60px;\">&#8211; Software configurable relay control<\/p>\n<ul>\n<li>Enhanced high performance LED lighting<\/li>\n<\/ul>\n<p style=\"padding-left: 60px;\">&#8211; Portable lighting recipes for all technologies<\/p>\n<p style=\"padding-left: 60px;\">&#8211; Tests all probe card technologies<\/p>\n<ul>\n<li>Closed loop stage with 0.1\u03bc encoders<\/li>\n<\/ul>\n<p style=\"padding-left: 60px;\">&#8211; 12\u201d x 8\u201d stage travel for largest cards<\/p>\n<p style=\"padding-left: 60px;\">&#8211; 300Kg force Z stage, 0.75\u201d travel<\/p>\n<ul>\n<li>Powerful, easy to use software<\/li>\n<\/ul>\n<p style=\"padding-left: 60px;\">&#8211; Simple test program generation<\/p>\n<p><img decoding=\"async\" src=\"..\/..\/..\/images\/equipment\/PB6500-2.jpg\" alt=\"\" width=\"100%\" \/><\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>PB6500 Datasheet | PB6500 Spec Sheet | PB6000 Series Datasheet The Probilt PB6500 has many features that make it the ideal analyzer for all probe card technologies, including the latest probe tip geometries being used to test leading edge semiconductor devices. Its excellent electrical measurement capability and the ability to drive relays on any channel [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":33,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-51","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/pages\/51","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/comments?post=51"}],"version-history":[{"count":9,"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/pages\/51\/revisions"}],"predecessor-version":[{"id":369,"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/pages\/51\/revisions\/369"}],"up":[{"embeddable":true,"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/pages\/33"}],"wp:attachment":[{"href":"https:\/\/www.inttechcorp.com\/equipment\/wp-json\/wp\/v2\/media?parent=51"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}