Productivity Solutions for Probe and Test

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ITC55100C

Parallel Energy Path (Crowbar) – Patent Application Pending

Parallel energy path triggered by breakdown voltage drop during avalanche test

Provides protection to DUT and probe card during production wafer probe, reduces “debris” on wafer

Limits DUT damage to allow better FA

Standard on ITC75100 and ITC75300

Optional on all ITC55XXXC model testers