ITC55300C

ITC55300C Datasheet | ITC55300C Spec Sheet

Model ITC55300C is the high current (400A) version of the ITC55100C tester. The ITC55300C performs the same tests as the ITC55100C and includes Crowbar,WSS and many features that improve testing accuracy, test results collection, test results viewing, and multiple tester networking. The ITC55300C has the added capability of testing dual devices; N-channel, P-channel or combination.

Model ITC55300C performs ruggedness testing of power MOSFETs, discretes and modules and IGBTs, discretes and modules. It also tests single and dual diodes, and forward and reverse bias of IGBTs when used with an optional ITC55-RSF Output Selector Box.

The ITC55300C performs several types of tests that conform to MIL-STD-750C Method 3470. Method 3470 tests the capability of P- and N-Channel MOSFETs and IGBTs by stressing them to controlled energy levels. This is accomplished by the devices driving an unclamped inductive load.

Features

Single/Dual Device Testing
N channel, P channel, Mixed
All Solid State Switching – No Relays
EAR 1 Million pulses
Timing Resolution of 40ns
Current Range: 0.1A to 400A, 0.1A Steps
Avalanche Voltage to 2500V
Bipolar Gate Drive with 28V swing
Crowbar function
WSS remote sensing
New High Efficiency Kelvin Circuit
Touch-Screen Program Entry/Control
Waveform Capture/Display
Internal Test Program Storage (20 files)
Network capable software
High Speed Inductor Charging, Reduces Test Time
Programmable Leakage Test Voltage
Pre/Post Avalanche Leakage Test
Avalanche Collapse Test
Versatile Test Handler Control
Up to 15 Hardware Sort Bins
Improved Voltage/Current Accuracy
Software Updates via Flash Download
Password Control of Parameter Entry
Operates with all ITC Inductor Load Boxes
Interfaces with ITC55MUX4 & ITC55-RSF
Simple, Complete User Calibration
Built-in Self Test