PB1500

• Tips up configuration for easy repair
• Excellent ergonomics
• Fast retest without flip
• Closed loop with 0.1u encoders
• 6.4” x 9” stage movement
• Up to 3” x 3” arrays
• 100 lb. Force Z stage, 2.0” stroke
• 1,280 maximum test channels

Features

Fast, simple probe card repair

– Crosshair shows proper probe position

– Tips up configuration for easy repair

– Excellent ergonomics

– Fast retest without flip

– Leica MZ80 binocular microscope

Accurate, repeatable stage

– Closed loop with 0.1µ encoders

– 6.4” x 9” stage movement

– Up to 3” x 3” arrays

– 100 lb Force Z stage, 2.0” stroke

Simple, economical motherboards

– Up to 1,280 channels

– Fast change motherboards/probe cards

– Up to 15” diameter probe cards

Powerful Probilt™ software

– Same software as PB3600/6500

– Network with PB3600/6500

Works with all probe card technologies

– Test and repair any technology

– Excellent for tight pitch shelf cards

Tests Performed

Alignment
Planarity
Contact Resistance
Leakage
Wire Check
Capacitor values and leakage
Resistor values
Gram Force (optional)