PB6500

PB6500 Datasheet | PB6500 Spec Sheet | PB6000 Series Datasheet

The Probilt PB6500 has many features that make it the ideal analyzer for all probe card technologies, including the latest probe tip geometries being used to test leading edge semiconductor devices. Its excellent electrical measurement capability and the ability to drive relays on any channel make it the best tool for probe cards with complex circuits and relays on the PCB. With 300Kg of lift force, it has long been recognized as the analyzer of choice for vertical probe card manufacturers.

The ITC line of Probilt, probe card analyzers provide fast, accurate and repeatable test data for all types of probe card technologies. Simple user definable vision parameters allow even the newest and most complex probe tip geometries to be captured and accurately measured.

PB6500

• 11” x 9.5” chuck for 200mm arrays
• Motherboard/MUX Interface – No Cable
• Enhanced high performance LED lighting
• Closed loop stage with 0.1μ encoders
• 12” x 8” stage travel for largest cards
• – 300Kg force Z stage, 0.75” travel
• Powerful, easy to use software
• 16-bit Precision Measurement Unit
• Probe Tracker (Optional)
• 12,000 maximum test channels

Features

PB6500 offers 11 x9.5” chuck for 200 mm arrays
High volume production throughput

– Fast Quad Core Processor

– Distributed Processing

– Overlapped Tests

Motherboard/MUX Interface – No Cables

– 12,000 Channel Capability

– Kinematic coupling for high repeatability

– Fast motherboard and probe card change

– Software configurable relay control

Enhanced high performance LED lighting

– Portable lighting recipes for all technologies

– Tests all probe card technologies

Closed loop stage with 0.1μ encoders

– 12” x 8” stage travel for largest cards

– 300Kg force Z stage, 0.75” travel

Powerful, easy to use software

– Simple test program generation