Productivity Solutions for Probe and Test

Search Our Equipment & Products

ITC55100D-6KVN

ITC55100D-6KVN Datasheet | ITC55100D-6KVN Spec Sheet

Model ITC55100D-6KVN is the latest generation of the industry standard series of ITC55100 testers. The system has been designed around a very powerful micro-controller. Its response time to the peak and zero current is improved ten times. Combined this gives greater accuracy for the charging times, avalanche times, and for the reported peak drain current.

Model ITC55100D-6KVN has a bipolar gate drive and CROWBAR/Diode Driver as a standard feature. The user can set a total gate drive of up to 28V and can select how much of the 28V is positive and how much of it is negative. This feature ensures that the device is held off during avalanche as required for certain devices.

The ITC55100D-6KVN performs several types of tests that
conform to MIL-STD-750E Method 3470. Method 3470 tests the capability of N-Channel MOSFETs and IGBTs by stressing them to controlled energy levels. This is accomplished by the devices
driving an unclamped inductive load.

Features

  • Single Device Testing
  • N Channel Only
  • EAR 100 Million pulses
  • Timing Resolution of 100ns
  • Current Range: 0.1A to 200A, 0.1A Steps
  • Avalanche Voltage to 6000V
  • Bipolar Gate Driver with 28V swing
  • CROWBAR/Diode Driver
  • New High Efficiency Kelvin Circuit
  • Touch-Screen  Program Entry/Control
  • Waveform Capture/Display
  • Internal Test Program Storage (20 files)
  • High Speed Inductor Charging, Reduces Test Time
  • Programmable Leakage Test Voltage
  • Pre/Post Avalanche Leakage Test
  • Avalanche Collapse Test
  • Versatile Test Handler Control
  • Up to 15 Hardware Sort Bins
  • Improved Voltage/Current Accuracy
  • Software Updates via Flash Download
  • Password Control of Parameter Entry
  • Operates with all ITC HV Inductor Load Boxes
  • Simple, Complete User Calibration
  • Built-in Self Test