
ITC55100D-6KVN Datasheet | ITC55100D-6KVN Spec Sheet
Model ITC55100D-6KVN is the latest generation of the industry standard series of ITC55100 testers. The system has been designed around a very powerful micro-controller. Its response time to the peak and zero current is improved ten times. Combined this gives greater accuracy for the charging times, avalanche times, and for the reported peak drain current.
Model ITC55100D-6KVN has a bipolar gate drive and CROWBAR/Diode Driver as a standard feature. The user can set a total gate drive of up to 28V and can select how much of the 28V is positive and how much of it is negative. This feature ensures that the device is held off during avalanche as required for certain devices.
The ITC55100D-6KVN performs several types of tests that
conform to MIL-STD-750E Method 3470. Method 3470 tests the capability of N-Channel MOSFETs and IGBTs by stressing them to controlled energy levels. This is accomplished by the devices
driving an unclamped inductive load.
Features